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MIL-STD-883H, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (26 FEB 2010)., This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. The test methods, controls, and procedures described herein have been prepared to serve several purposes: a. To specify suitable conditions obtainable in the laboratory and at the device level which give test results equivalent to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic or outer space location, since it is known that the only true test for operation in a specific application and location is an actual service test under the same conditions. b. To describe in one standard all of the test methods of a similar character which now appear in the various joint-services and NASA microelectronic device specifications, so that these methods may be kept uniform and thus result in conservation of equipment, manhours, and testing facilities. In achieving this objective, it is necessary to make each of the general tests adaptable to a broad range of devices. c. To provide for a level of uniformity of physical, electrical and environmental testing; manufacturing controls and workmanship; and materials to ensure consistent quality and reliability among all devices screened in accordance with this standard.

标准名称：	城市生活垃圾卫生填埋场运行维护技术规程(附条文说明)
英文名称：	Technical specification for operation and maintenance of municipal domestic refuse sanitary landfill
中标分类：	工程建设 >> 城乡规划与市政工程 >> 园林绿化与市容卫生
发布部门：	中华人民共和国建设部
发布日期：	2003-03-17
实施日期：	2003-05-01
首发日期：
作废日期：
起草单位：	华中科技大学环境科学与工程学院
起草人：	陈海滨、冯向明、李辉等
出版社：	中国建筑工业出版社
出版日期：	2003-05-01
页数：	47页

为实现城市生活垃圾卫生填埋场科学管理、规范作业、安全运行，以提高效率、降低成本、有效防治二次污染，达到生活垃圾无害化处置的目的，制定本规程。本规程适用于城市生活垃圾卫生填埋场的运行、维护及安全管理。

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